Feb 4 2016
Cleanroom operators will now be able to detect the presence of extremely low levels of microbial cells on surfaces much faster than traditional solutions. The capability is a result of a global marketing agreement between MOCON, Inc. and Particle Measuring Systems.
MOCON’s GreenLight® system has a proven track record in reliability, sensitivity and speed across applications in many industries. It requires a fraction of the time needed by traditional plate counting methods to achieve results. The agreement gives Particle Measuring Systems exclusive rights to market GreenLight® technology to pharmaceutical companies worldwide.
To improve cleanroom testing, Particle Measuring Systems has developed the SurCapt™ Microbial Surface Detection Kit, using GreenLight® technology. This provides an all-inclusive, ready-to-use solution which simplifies and accelerates environmental surface testing for biological contamination. The design of the SurCapt kit reduces the likelihood of sample cross contamination and mishandling by the operator.
“By leveraging GreenLight® technology with our SurCapt™ Microbial Detection Kit, we are providing pharmaceutical companies the objective evidence they are currently missing in a timeframe that enables more effective decision-making. This breakthrough enhances quality assurance throughout the value chain,” said Giovanni Scialo, vice president, life sciences, Particle Measuring Systems.
About Particle Measuring Systems
Particle Measuring Systems, a Spectris company, provides life science and electronic companies with the contamination monitoring solutions needed for sterility assurance and yield loss protection. For more information visit www.pmeasuring.com
About MOCON
MOCON is a leading provider of detectors, instruments, systems and consulting services to research laboratories, production facilities, and quality control and safety departments in the medical, pharmaceutical, food and beverage, packaging, environmental, oil and gas and other industries worldwide. See www.mocon.com for more information.
Source: http://pmeasuring.com/