SIM Series ultra-high speed framing cameras from Specialised Imaging incorporate an auxiliary optical port enabling secondary instruments such as streak cameras, high speed video or time resolved spectrometers to share the same optical axis as the framing channels.
The ability, without compromise, to simultaneously analyse transient events with hyphenated time resolved imaging technologies opens the door to dissecting even the most complex ultra fast processes.
Recording simultaneous ultra fast two-dimensional and time-resolved images is of significant interest to scientists in a growing number of fields of study including detonics, cavitation, plasma, and material science because you can now accurately correlate the events with different type of optical instruments to analyse processes that happens during or after the initial event captured by the SIM camera.
Capable of scanning up to 1 billion frames / second, the compact SIM ultra fast framing camera system combines ease of use, high reliability and high performance. The intuitive design of the SIM camera allows even occasional users to achieve top quality results. A novel optical periscope for focus adjustment enables rapid and simple experimental setup and optimisation. Comprehensive triggering facilities, highly accurate timing control, and a wide range of output signals, coupled with a software package that includes full measurement and image enhancement functions simplifies image capture. Full remote operation using Ethernet connectivity comes as standard enabling the SIM to be easily integrated into almost any environment.
Unlike many traditional ultra fast framing cameras the optical design of the SIM provides the choice of up to 16 separate optical channels without compromising performance or image quality. Effects such as parallax and shading, inherent in other designs, are eliminated and the high spatial resolution (> 36 lp/mm) is the same from frame to frame and in both axes. Individual ultra-high resolution intensified CCD detectors, controlled by state-of-the-art electronics, offer almost infinite control over gain and exposure allowing researchers total freedom to capture images of even the most difficult transient phenomena.
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