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Results 1 - 10 of 19 for Force microscopy
  • Why Are Bolometers Useful for Studying Materials?
    Article - 22 Jan 2024
    Explore the evolution of bolometers in materials science, from infrared detection to advanced graphene-based designs for sensitive radiation measurement.
  • Taking a Closer Look at the Global Image Sensor Market
    Article - 13 Sep 2022
    AZoSensors takes a deep dive into how image sensors are currently being used, where research and development are focused, what the market looks like, and how the sector may evolve into the future.
  • How are qPlus Sensors Used in Biological Research?
    Article - 14 Apr 2022
    Recent research has demonstrated that it is possible to image biological samples in a liquid medium using stiff qPlus sensors
  • qPlus Sensors in Atomic Force Microscopy
    Article - 15 Mar 2022
    qPlus based AFM is known as the best method to study equipment and materials at ultralow temperatures as it allows examining and navigating even the nonconductive parts of the equipment and materials.
  • SERS VOC Sensor Could be Utilized in Space
    Article - 24 Nov 2021
    Researchers have developed a hybrid SERS platform, supported by a nanoplasmonic porous silicon membrane, capable of detecting trace levels of VOCs.
  • Using AFM Cantilevers as Nanomechanical Sensors
    Article - 6 Apr 2020
    It became apparent in the early 2000s that AFM cantilevers could be used as chemical and biochemical nanomechanical sensors through coating the probe tip with various chemical substances.
  • Sensing Probes in Infrared Spectroscopy
    Article - 21 Feb 2020
    Infrared (IR) spectroscopy is a non-destructive spectroscopic technique that provides a molecular fingerprint. Sensing probes in IR Spectroscopy have many uses, including scanning biological cells,...
  • Sensing Properties of Metals
    Article - 4 Feb 2020
    The capacity to assess the properties of metal is valuable for all kinds of applications in research and industry.
  • What are Atomic Force Microscopy Stress Sensors?
    Article - 29 Jan 2020
    Atomic force microscopy, also known as AFM, is a high resolution procedure used to acquire images and other figures from a variation of materials.
  • Using Surface Enhanced Raman Spectroscopy for Molecular Sensing
    Article - 8 Oct 2019
    In 1928, the famous Indian physicist CV Raman discovered the inelastic scattering of photons from an atom or a molecule. This effect was thus called Raman scattering or the Raman Effect.

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