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Results 11 - 20 of 223 for Microscopy
  • News - 6 Sep 2010
    The physicists of the National Institute of Standards and Technology (NIST) have exploited miniature ion crystals for measuring forces in the yoctonewton range. The yoctonewton (mass equivalent to...
  • News - 8 Jun 2010
    Currently designed 3-D Hall magnetic-field based silicon gadgets have important disadvantages, which include many contacts, a minimum of eight, thereby complicating the realization of the technology,...
  • Supplier Profile
    At Polytec, we specialize in advanced optical measurement systems and cutting-edge testing services, all tailored to meet your unique needs. Our focus is your success. With a dedicated commitment to...
  • Supplier Profile
    DECTRIS is the first company worldwide to sell novel hybrid-pixel X-ray detector systems which operate in single-photon counting mode. This new technology features a very high dynamic range, a short...
  • Article - 27 Feb 2025
    Achieve superior spatial resolution in ultrasonic imaging with the GaGe RazorMax digitizer, featuring high vertical resolution and 1 GS/s sampling capabilities.
  • Article - 15 Mar 2022
    qPlus based AFM is known as the best method to study equipment and materials at ultralow temperatures as it allows examining and navigating even the nonconductive parts of the equipment and materials.
  • Article - 2 Dec 2019
    Electron microscopy (EM) is a powerful tool in the repertoire of any scientist or researcher, enabling the visualization of samples at the atomic level.
  • Article - 15 Aug 2019
    Charge-coupled devices (CCDs) are now one of the most common sensors used in optical microscopy, as well as many other characterization techniques.
  • Article - 26 Mar 2019
    High-resolution cameras, based on charge-coupled devices (CCDs) & complementary metal-oxide-semiconductor (CMOS) image sensors, have been replacing traditional cameras in microscopy.
  • Article - 4 Feb 2019
    Encoder sensors have been developed and tested for their usefulness when applied to electron microscopy (EM) systems.

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