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Results 51 - 60 of 230 for Microscopy
  • Veredus Laboratories
    Supplier Profile
    Veredus Laboratories is a global biotechnology company that markets, develops and customizes innovative solutions for detection of pathogens. The VereChip™ combines two time-tested technologies...
  • Bruker
    Supplier Profile
    The Bruker name has become synonymous with the excellence, innovation and quality that characterizes our comprehensive range of scientific instrumentation. Bruker's trusted solutions encompass a...
  • Agilent Technologies, Inc.
    Supplier Profile
    Agilent is the world’s premier measurement company. Agilent works in close collaboration with engineers, scientists, and researchers around the globe to meet the communications, electronics,...
  • Allied Vision Technologies, Inc.
    Supplier Profile
    Allied Vision Technologies is a 100% subsidiary of the publicly-traded Augusta Technologie AG. AVT designs, produces and sells cameras and components for image processing in industrial and life...
  • imec
    Supplier Profile
    Imec is a world-leading research and innovation center in nanoelectronics and digital technologies. Imec leverages its state-of-the-art R&D infrastructure and its team of more than 5,000 employees...
  • Hybrid pixel detectors improve dynamic range, speed, and sensitivity for a broad range of TEM applications
    Article - 18 Nov 2019
    Hybrid pixel detectors count individual photons will revolutionize electron microscopy and TEM applications by improving, dynamic range, speed and sensitivity.
  • Automated Fluorescence Filter Wheel - A Video from Dover Motion
    Video
    Originally developed for a Gene Sequencing Motion Core, Dover Motion's rotary filter wheel can be used for many different applications for Automated Fluorescence Microscopy.
  • Parallel Probes for SPMs Allow Simultaneous Sensing of Thermal and Mechanical Properties
    News - 3 Jul 2011
    Angelo Gaitas, President of PicoCal Inc., announces the completion of PicoCal’s SBIR Phase II NSF grant Award No. 0822810, which resulted in a number of breakthrough innovations in high...
  • Imec and PVA Tepla Use GHz SAM Technology to Detect TSV Voids at Wafer-Level
    News - 19 Jan 2013
    Imec and PVA Tepla present breakthrough results in the detection of TSV voids in 3D stacked IC technology. After having applied Scanning Acoustic Microscopy to temporary wafer (de)bonding inspection,...
  • New Hybrid Technique Detects Trace Chemicals, Explosives
    News - 15 Mar 2010
    Arizona State Univeristy scientist N.J. Tao and his colleagues at the Biodesign Institute have hit on a new, versatile method to significantly improve the detection of trace chemicals important in...

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