Hamamatsu Photonics announces an upgraded version of its MEMS FPI spectroscopic modules. Designed for short wave infrared (SWIR) analysis, the C17752, C17753 and C17754 compact sensors offer improved signal to noise performance and enhanced stray light rejection, supporting more reliable material analysis in cost sensitive and space constrained applications.
MEMS FPI. Image Credit: ©Hamamatsu Photonics
Key Benefits
The updated MEMS-FPI modules introduce design enhancements that improve measurement stability and spectral clarity. These spectroscopic modules are engineered to support efficient SWIR analysis while keeping integration complexity and cost low.
Key Benefits Include:
- Improved signal-to-noise performance supports stable and repeatable spectral measurements
- Enhanced stray-light suppression contributes to clearer spectral data
- Compact, integrated design enables use in space-constrained and embedded systems
- Optional fiber adapter with integrated lens supports transmission measurements and flexible system design
- USB plug-and-play operation allows quick setup without complex optical alignment
- Cost-efficient solution for accessible SWIR spectroscopy
Incorporating a MEMS-FPI spectrum sensor and an integrated light source, they offer the following:
| Part no. |
Spectral response
range |
Spectral resolution
(FWHM) (typ.) |
Wavelength
reproducibility
(typ.) |
Wavelength
Temperature
dependance |
| C17552 |
1350 to 1650 nm |
18 nm |
± 2 nm |
± 0.1 nm/°C |
| C17553 |
1550 to 1920 nm |
21 nm |
± 2 nm |
± 0.1 nm/°C |
| C17554 |
1750 to 2150 nm |
22 nm |
± 2 nm |
± 0.1 nm/°C |
Target Applications
The upgraded MEMS-FPI module supports a range of industrial and analytical applications, including:
- Material sorting
- Quality control and inspection
- Process monitoring
- Embedded and portable spectroscopy systems
- Laboratory and industrial R&D
For full technical details, visit the C17752, C17753 and C17754 product pages and datasheets on the Hamamatsu Photonics website.