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Nanowire Sensors for Point-of-Care Diagnostic Solutions

Singapore-oriented Institute of Microelectronics (IME) will be associating with the University of Illinois at Urbana-Champaign for investigating novel methodologies to configure and develop nanowire sensing devices.

Their ultimate focus is on producing marketable sensing units that can be utilized in point-of-care diagnostic solutions for identifying specific cancer-causing proteins.

This collaboration will help in combining the technologies for developing silicon-oriented nanowire field-effect transistor (FET) sensing units in Singapore employing FET nanoplate sequences that have been structured in Illinois. These systems will be manufactured at the company’s 8-inch CMOS fab located in Singapore.

The scientists hope that such unique silicon nanowire sensing devices can facilitate speedy, economical and high-throughput biological examinations. Conversely, they could not locate any actual methodology for structuring and fabricating these solutions with reliable, repeatable results.

Chen Yu, a principal investigator at IME stated that, there are many unidentified factors existing behind such tests, including the effects of contiguous environment and the electrostatic testing on the nanowire sensor efficiency.

The point-of-care test solutions is one among the progressive areas in health care, and the market is likely to exceed $22.5 billion in 2013.


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