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Results 1 - 10 of 30 for Atomic-force microscopy
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    100 years of Anton Paar A century: Great people | Great instruments The “Anton Paar” success story began on January 4, 1922, when Anton Paar started his metalworking shop. Back then, it...
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    For over 40 years Polytec has provided high-technology, laser-based measurement solutions to researchers and engineers. Our commitment is to provide the most precise and reliable optical instruments...
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    NuNano is a UK-based company specializing in the design and manufacture of probes for atomic force microscopy and cantilever-based sensor devices. It was founded in 2011 by Dr James Vicary and...
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    FormFactor FRT Metrology manufactures 3D surface measurement technology for research and production. Our high-precision measuring instruments are based on SurfaceSensTM multi-sensor concept and are...
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    Optophase is a European distributor which provides a wide range of products: Nanopositioners Micropositioners Microscopy products Atomic force microscopy Nanoindenter Optical...
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    SEMI is the global industry association serving the manufacturing supply chain for the micro- and nano-electronics industries, including: Semiconductors Photovoltaics (PV) High-Brightness...
  • Article - 29 Jan 2020
    Atomic force microscopy, also known as AFM, is a high resolution procedure used to acquire images and other figures from a variation of materials.
  • News - 8 Jun 2010
    Currently designed 3-D Hall magnetic-field based silicon gadgets have important disadvantages, which include many contacts, a minimum of eight, thereby complicating the realization of the technology,...
  • Article - 15 Mar 2022
    qPlus based AFM is known as the best method to study equipment and materials at ultralow temperatures as it allows examining and navigating even the nonconductive parts of the equipment and materials.
  • Article - 27 Oct 2018
    Atomic Force Microscopy (AFM) is a microscopy technique within the branch of scanning probe microscopy (SPM) that is used to obtain a topographic image of a specimen at nanometer (nm) resolution.