Over the last 25 years, NT-MDT has been involved in the development, production and support of research instrumentation, primarily, atomic force microscopes (AFM) and its combinations with ultrahigh...
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Atomic force microscopy
Article - 27 Oct 2018
Atomic Force Microscopy (AFM) is a microscopy technique within the branch of scanning probe microscopy (SPM) that is used to obtain a topographic image of a specimen at nanometer (nm) resolution.
News - 8 Jun 2010
Currently designed 3-D Hall magnetic-field based silicon gadgets have important disadvantages, which include many contacts, a minimum of eight, thereby complicating the realization of the technology,...
News - 10 Feb 2012
NT-MDT, a manufacturer of scanning probe microscopes, atomic force microscopes and nanotechnology-related instrumentation and technology, headquartered in Moscow, has announced the winners of the 2011...
News - 6 Dec 2011
Researchers belonging to the University of Limoges in France have demonstrated the possibility of creating three-dimensional silicon oxide nanodots on silicon films at the micrometric scale, within a...
News - 12 Aug 2010
The microelectromechanical system (MEMS) technology enables small machine to fine-tune itself so as to make highly precise sensors which could serve medical diagnostics, environmental testing and...
Article - 19 Dec 2018
The sensor or probe tip is all-important in the functioning of AFM. While most AFMs currently make use of micromachined force sensors.
News - 18 Mar 2015
Following an excellent final at Corpus Christi College, Cambridge, Oxford Instruments is delighted to announce the winner of the iCAN UK 2015 contest ‘Oxford Instruments Special Award’ was...
News - 3 Jul 2011
Angelo Gaitas, President of PicoCal Inc., announces the completion of PicoCal’s SBIR Phase II NSF grant Award No. 0822810, which resulted in a number of breakthrough innovations in high...