BinMaster Level Controls has developed a bendable capacitance probe designed to fit in tight spaces or in vessels where obstructions prevent the installation of a straight probe.
This probe can be bent to avoid obstructions in a vessel while still allowing adequate probe surface area to confirm the presence or absence of material. Mounted on the side of the bin, the bendable probe can be used in a wide range of solid materials or slurries.
One common application for the bendable probe is for high and low level detection in smaller mixers or containers used in food processing plants. Like all BinMaster capacitance probes, the bendable probe offers interference-free, fail-safe operation & "Quick-Set" calibration. BinMaster capacitance probes provide interference-free operation – working far below the RF level of 9 KHz at just 6 KHz – and will not interfere with two-way radios or other equipment operating in the radio spectrum.
Standard capacitance probe features include a triple-thread, screw-off cover that allows easy access to internal components and an FDA-recognized powder coat finish. This housing also has dual conduit entries to simplify wiring and installation. The dual time delay feature allows the user to set flexible time delays up to 30 seconds for covered and uncovered conditions.
BinMaster is a division of Garner Industries – an ISO 9001:2008 certified company established in 1953 and headquartered in a 75,000 square foot manufacturing facility in Lincoln, Nebraska, USA. BinMaster is strategically focused on designing, manufacturing and marketing reliable, proven sensoring devices for the measurement of bulk solid and liquid materials for the feed and grain, food, plastics, pulp & paper, power, mining, and concrete industries.
The BinMaster product line is sold worldwide and features many diverse technologies for bin level indication and measurement, being well known for its SmartBob2 and 3DLevelScanner advanced inventory management solutions. For more information about BinMaster, visit www.binmaster.com.