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Results 1 - 10 of 45 for Cantilevers
  • Supplier Profile
    NuNano is a UK-based company specializing in the design and manufacture of probes for atomic force microscopy and cantilever-based sensor devices. It was founded in 2011 by Dr James Vicary and...
  • News - 10 Aug 2010
    SiTek Electro Optics AB have enhanced their series of position sensing detectors (PSDs), by the addition of a PSD array with 16 parallel, one-dimensional PSD constituents, on one and the same chip....
  • Article - 7 Aug 2012
    This article takes the reader through a basic structural and functional principle to cantilever sensor technology for DNA detection.
  • Article - 5 Dec 2017
    Frequency analysis is a standard method used for studying challenging applications & measuring frequency-dependent mechanical motion of machine components.
  • Article - 27 Oct 2018
    Atomic Force Microscopy (AFM) is a microscopy technique within the branch of scanning probe microscopy (SPM) that is used to obtain a topographic image of a specimen at nanometer (nm) resolution.
  • Article - 6 Apr 2020
    It became apparent in the early 2000s that AFM cantilevers could be used as chemical and biochemical nanomechanical sensors through coating the probe tip with various chemical substances.
  • Equipment
    The cantilever beam load cell offered by Thames Side Sensors is a fully welded stainless steel load cell, which is hermetically sealed to IP68.
  • News - 31 Jul 2012
    A sensor technology that enables measuring samples at the cellular level is now being honed by Drexel University researchers for achieving more quick and precise detection of DNA traces within liquid...
  • Article - 29 Jan 2020
    Atomic force microscopy, also known as AFM, is a high resolution procedure used to acquire images and other figures from a variation of materials.
  • Article - 19 Dec 2018
    The sensor or probe tip is all-important in the functioning of AFM. While most AFMs currently make use of micromachined force sensors.