NuNano is a UK-based company specializing in the design and manufacture of probes for atomic force microscopy and cantilever-based sensor devices. It was founded in 2011 by Dr James Vicary and...
News - 10 Aug 2010
SiTek Electro Optics AB have enhanced their series of position sensing detectors (PSDs), by the addition of a PSD array with 16 parallel, one-dimensional PSD constituents, on one and the same chip....
Article - 7 Aug 2012
This article takes the reader through a basic structural and functional principle to cantilever sensor technology for DNA detection.
Article - 5 Dec 2017
Frequency analysis is a standard method used for studying challenging applications & measuring frequency-dependent mechanical motion of machine components.
Article - 27 Oct 2018
Atomic Force Microscopy (AFM) is a microscopy technique within the branch of scanning probe microscopy (SPM) that is used to obtain a topographic image of a specimen at nanometer (nm) resolution.
Article - 6 Apr 2020
It became apparent in the early 2000s that AFM cantilevers could be used as chemical and biochemical nanomechanical sensors through coating the probe tip with various chemical substances.
The cantilever beam load cell offered by Thames Side Sensors is a fully welded stainless steel load cell, which is hermetically sealed to IP68.
News - 31 Jul 2012
A sensor technology that enables measuring samples at the cellular level is now being honed by Drexel University researchers for achieving more quick and precise detection of DNA traces within liquid...
Article - 29 Jan 2020
Atomic force microscopy, also known as AFM, is a high resolution procedure used to acquire images and other figures from a variation of materials.
Article - 19 Dec 2018
The sensor or probe tip is all-important in the functioning of AFM. While most AFMs currently make use of micromachined force sensors.