ReflectCONTROL sensors provide a novel method for detecting defects on highly reflective and clear surfaces. These sensors employ phase-measuring deflectometry to provide full-surface measurements.
In contrast to traditional visual inspection by people, which requires a significant amount of labor and work time, the reflectCONTROL sensor provides precise measurement data that allows for a complete examination of surface quality. There are powerful software tools for assessment and parameterization that can considerably increase surface inspection efficiency and accuracy.
Deflectometry Sensor for 3D Measurements of Shiny Surfaces

Image Credit: Micro-Epsilon
The RCS130-160 3D HLP is meant to measure the shape of shiny objects. This sensor displays a striped pattern that is reflected by the measuring object's surface into the sensor cameras. The sensor generates a 3D image of the surface, allowing the topology of the components (flatness, deflection, curvature) to be calculated.
The RCS130 type is specifically designed for measurement and inspection tasks, such as in manufacturing lines. Furthermore, the sensor features a GigE Vision interface that provides GenICam-compliant data.
Surface Inspection of Shiny Components

Image Credit: Micro-Epsilon
The reflectCONTROL RCS110-245 2D with integrated controller is intended for use in stationary measurements or machine integration. This small sensor detects irregularities on shiny surfaces, which are then processed and shown as reflectivity and curvature images via software. GigE Vision permits the transmission of surface images to a variety of image processing software packages for additional analysis.
The reflectCONTROL RCS130-160 3D HLP has all of the same features as the RCS110-245 2D. As a result, both sensors provide strong surface inspection solutions while also allowing for smooth interaction with current systems.
Key Features
- The sensor generates 3D data with up to 5 million points
- Resolution in the nanometer range in the Z-axis direction
- XY resolution 100 µm
- Powerful 3DInspect software
- Optimized camera setup for sharper 2D images
- Detects variations as small as 10 nm
- Generate 3D point clouds for precise height measurement