Posted in | Thermal Analysis

Near-IR CCD Camera for Silicon Device Inspection – C3077-80

Hamamatsu offers a VGA format CCD camera, the C3077-80, which has a high sensitivity in the near infrared (NIR) region. The camera features EIA output, which is used extensively in the industry. When compared to Hamamatsu’s traditional model, the spectral response at 900 nm is improved more than twice.

Thanks to its high sensitivity in the NIR region, the C3077-80 CCD camera is ideal for imaging inside a silicon device.

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Key Features

  • EIA output
  • High sensitivity in the NIR region


  • Internal inspection of silicon devices
  • Inspection of ceramic substrates
  • COG alignment
  • Silicon wafer / device alignment

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