IAR Embedded Workbench Provides Multicore Debugging for New NXP Dual-Core Series

IAR Systems® announces that its development toolchain IAR Embedded Workbench® for ARM® provides excellent performance and multicore debugging for the new ultra-low-power LPC54100 microcontroller series from NXP Semiconductor.

The series is targeted for applications with demands on always-on sensor processing and high sensor density, typically seen within implementations for wearable health and fitness applications, gaming, and industrial applications such as environmental monitoring, home and building automation, lighting and robotics.

IAR Embedded Workbench for ARM includes leading code optimization techniques that produce the fastest performing code on the market. The fast performing code has a significant impact on keeping the application’s power consumption to a minimum. Using IAR Systems’ probe I-scope™, developers can also test and tune their applications for power optimization and extend battery lifetime by learning the power consumed by individual modules and detect code design flaws causing unnecessary power consumption.

The LPC54100 series features an asymmetric dual-core architecture based on ARM Cortex®-M4F and ARM Cortex-M0+. For maximal power/performance efficiency, developers can use the low-power ARM Cortex-M0+ core for sensor data collection, aggregation, and external communications and the ARM Cortex-M4F core for more math-intensive algorithms.

“We are excited to see early tools support in IAR Embedded Workbench for our new LPC54100 series microcontrollers,” says Brendon Slade, Director, Tools and Embedded Ecosystems, Microcontroller business line, NXP. “The advanced code optimization capabilities along with power analysis features enable users to extract the full potential of the LPC54100 series for always-on sensor processing applications, such as wearables, mobile devices, gaming, robotics, and more.”

Source: http://www.iar.com/

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