Posted in | Sensors General

Akrometrix Announces Next-Generation AXP Shadow Moiré System

Akrometrix, LLC, the leading provider of thermal warpage and strain metrology equipment to both the front- and back-end semiconductor and electronics industries, today announced its next-generation Shadow Moiré System – the AXP 2.0.

Akrometrix has been supplying thermal warpage systems for more than 20 years utilizing the shadow moiré technique and has now developed its next-generation AXP which provides unparalleled warpage metrology with state-of-the-art lateral/top-bottom temperature uniformity.

This new AXP 2.0 is the industry leader in not only providing thermal warpage, but has optional modules for both DIC strain/CTE measurements and DFP for discontinuous surfaces.

Utilizing a novel combination of both top and bottom heaters with shadow moiré, Akrometrix is providing temperature uniformity previously unattainable in the industry on a flexible/configurable platform.

The significant engineering expertise at Akrometrix has enabled us to develop this next-generation system for warpage metrology that will meet our customers’ technology needs today and for the next several years. With the uniformity improvements, along with a wide range of other developments, the AXP 2.0 is well positioned to maintain Akrometrix’s market leader position of providing quick, timely and innovative solutions for our customers’ warpage metrology demands.

Mayson Brooks, Akrometrix’s CEO

For more information about Akrometrix’s warpage metrology systems, please contact [email protected] or visit

About Akrometrix LLC
Akrometrix is the leader in thermal warpage and strain metrology for the front-end/back-end wafer, back-end packaging/assembly, panel and the PCB/component markets. The company provides both capital equipment and test services to measure warpage and strain in temperatures from -50°C to 300°C on virtually any substrate up to 600mm x 600mm, regardless of shape. Located in Atlanta, Georgia, Akrometrix has been serving customers worldwide for more than 20 years based on technology developed at Georgia Tech. For more information, contact Akrometrix at [email protected] or visit

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