Eddyfi Technologies is proud to announce the release of the new generation of M2M Gekko, the state-of-the-art phased array flaw detector.
M2M Gekko™ PAUT & TFM flaw detector
Launched in December 2013, the first Gekko generation has brought a wind of change to the NDT market by offering embedded real-time TFM in addition to beam-forming phased array and conventional UT technology through a modern intuitive software interface.
Built on the strength of its predecessor, the new Gekko generation benefits from the latest hardware evolution that includes a higher firepower and channel sensitivity, the longest battery autonomy in its class (up to 6 hours in normal use), a brighter resistive and sensitive touchscreen that can be used with gloves or under rough conditions. For data management, it comes with a 256 GB SSD and a new USB 3.0 connector allowing a high-speed file transfer and wireless compatibility for data or screen sharing. The new IP68 LEMO encoder connector makes it fully robust and compatible with most of the standard scanners up to 3 encoded axes. The corresponding 3.0 Capture software release includes scan plan features, high resolution TFM inspection, an improved adaptive inspection feature and, as usual with the Capture release, a lot of new functionalities requested by inspectors.
Available in 32:128PR, 64:64PR or 64:128PR PAUT configuration, Gekko is now the most versatile advanced PAUT field unit able to cover a full range of inspection cases such as weld inspection, defect characterization, corrosion inspection, HTHA early detection, and more.
The new Gekko combines the advantages of a multiplexed portable equipment able to cover important areas and to drive multiple phased array probes for advanced inspection and fulfill all standard weld procedures while maintaining its TFM and expertise capabilities at the top.
Source: http://www.eddyfitechnologies.com