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New SIL 2 Certifications for the H250 M40

The H250 M40 variable area flowmeter receives new SIL 2 certifications, setting a new benchmark for functional safety of variable area flowmeters in the process industry: certification body exida has awarded SIL 2 certification to the device's limit switches and, for the first time, to the device's 4...20 mA analogue output.

H250 M40 now with SIL 2 certification for limit switches and 4…20 mA output. Image Credit: KROHNE

The certification does not only include the random failure rates of the hardware, which were determined by an FMEDA and confirmed with field data, but also proof of the systematic capability of the software and hardware due to suitable development and manufacturing processes in accordance with the requirements of IEC 61508:2010 Part 1-3. It replaces the previous manufacturer's declaration (SIL 2 for limit switches and SIL 1 for the 4…20 mA output).

The H250 M40 is the standard variable area flowmeter for applications in the process industries and OEM sector. It combines reliable measurement of liquids and gases with modern communication and diagnostic functions. Additional electronic modules can be added or replaced at any time without interrupting the process, allowing the device's functionality to be adapted to new requirements – from analogue flow measurement without auxiliary power to full digital integration into fieldbus systems.

The robust all-metal flowmeter is available in a wide range of materials and configurations and is suitable for demanding process conditions, including high pressures (up to 1000 barg / 14,500 psig), extreme temperatures (-196…+400 °C / -320…+752 °F), and aggressive media. It can also be installed horizontally or in vertical downflow lines up to DN150 / 6". Variants for hygienic applications further enhance the portfolio. Additional device and application diagnostics – such as detection of float blockages, gas compression oscillations of the float or pulsating flows – help to improve operational safety in demanding plant environments and extend the lifetime of the device if corrective measures are taken in the application on the basis of theses diagnostics.

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